Materials Characterization Techniques I | Department of Physics

Materials Characterization Techniques I

This course covers the basic interaction of matter with photons, elastic and non–elastic scatterings, characterization techniques: Ultra-violet photoelectron spectroscopy (UPS), Raman spectroscopy, Extended X-ray absorption fine structure (XAFS), X-ray fluorescence, Fourier transform infrared spectroscopy (FTIR), UV- Visible spectroscopy, Photoluminescence (PL), Electroluminescence (EL) and Cathode luminescence (CL).

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